W e l c o m e
With the increasing use of software systems comes the need for better software quality control techniques.
Software quality is a broad concept that has many manifestations in areas like software reliability, software security,
software testing, software maintenance, and so on. These areas share the common objective of preventing, detecting, and correcting faults.
Yet, the concept of faults, despite its importance, is marked by considerable confusion.
The terminology in the field is not coherent. How we group faults and relate them to each other, conceptually and from a diagnostic and solution perspective differs. In this workshop, we look at specific reliability issues of software faults, defects, anomalies or bugs, for a wide variety of industries and types of systems with the goal to identify similarities, differences in processes, categorizations, diagnostics and solutions. A good starting theme would be to look at run-time crashes of systems, and how we relate them to design and implementation flaws. In addition, while the general concept of faults is well studied in areas like software testing, domain-specific faults have not received as much attention.
The goal of this first International Workshop on Software Faults (IWSF'16) is to bring together researchers and practitioners working in various areas of software and system engineering to reason about the concept of faults, share results and ongoing work, and foster collaborations. IWSF 2016 is collocated with ISSRE 2016 (27th International Symposium on Software Reliability Engineering, Ottawa, Canada), which will be held in the beautiful city of Ottawa, ON, Canada, from October 23rd to 27th, 2016.
We invite researchers and practitioners to submit research papers, position papers, experience reports, and discussion papers.
Topics include but are not limited to:
- Relationship between run-time crashes and fault types
- Relationship between faults, defects, anomalies and bugs
- Fault diagnosis techniques across industry sectors
- Fault taxonomy and classification
- Fault management processes
- Domain specific faults
- Metrics and measurements, and estimation
- Supporting tools and automation
- Faults in emerging domains such as cloud computing and IoT
- Industry best practices
Date of the workshop: Monday October 24 from 8:30am to Noon.
- Session 1: Understanding Software Faults in Various Domains
- 08:30am - 08:45am Introduction to the workshop, Wahab Hamou-Lhadj, Sigrid Eldh, Alf Larsson
- 08:45am - 09:05am The Relationship Between Software Bug Type and Number of Factors Involved in Failures, Zachary Ratliff, Richard Kuhn, Raghu Kacker, Yu Lei and Kishor Trivedi
- 09:05am - 09:20am Programming the Network: Application Software Faults in Software-Defined Networks, Lalita Jagadeesan and Veena Mendiratta
- 09:20am - 09:40am On Automatic Detection of Performance Bugs, Sokratis Tsakiltsidis, Andriy Miranskyy and Elie Mazzawi
- 09:40am - 10:00am Discussion
- 10:00am - 10:30am Coffee Break
- Session 2: Detection of Software Faults
- 10:30am - 10:50am GPU Acceleration of Document Similarity Measures for Automated Bug Triaging, Tim Dunn, Natasha Kholgade Banerjee and Sean Banerjee
- 10:50am - 11:10am Healing Data Loss Problems in Android Apps, Oliviero Riganelli, Daniela Micucci and Leonardo Mariani
- 11:10am - 11:25pm TestEX: A Search Tool for Finding and Retrieving Example Unit Tests from Open Source Projects, Danielle Gonzalez, Mehdi Mirakhorli and Andrew Popovich
- 11:25pm - 11:45pm Discussion
- 11:45pm - 12:00pm Wrap-up
- Paper submission deadline: July 29, 2016
- Notification to authors: August 19, 2016
- Camera-ready copies: August 28, 2016
- Workshop date: Monday October 24, 2016
- The workshop will be one full day, discussion-oriented. Afterwards, each participant will be asked to formulate a short summary of the workshop (maximum 250 words), highlighting points of interest of his or her research. These summaries will be posted on the IWSF website, so that possible collaborations will become visible.
- Papers should not exceed 6 pages. All papers should be submitted as PDF files following the IEEE two-column proceedings format.
- Please submit through Easychair.
- Accepted peer-reviewed papers will be included in a supplemental volume of the ISSRE conference proceedings, and published by the IEEE Computer Society on IEEE Xplore
- Wahab Hamou-Lhadj, Concordia University, Montreal, QC, Canada
- Sigrid Eldh, Ericsson, Stockholm, Sweden
- Alf Larsson, Ericsson, Stockholm, Sweden