IWSF 2020

The 4th International Workshop on Software Faults (IWSF)

NOTE: ISSRE 2020 including its workshops will be a full virtual conference due to the current worldwide situation regarding COVID-19. Authors of accepted workshop papers are expected to give a remote talk, with no in-person attendance.

NEWS: IWSF is merged with SHIFT (the 2nd Annual International Workshop on Software Hardware Interaction Faults).

With the increasing use of software systems comes the need for better software quality control techniques. Software quality is a broad concept that has many manifestations in areas like software reliability, software security, software testing, software maintenance, and so on. These areas share the common objective of preventing, detecting, and correcting faults. Yet, the concept of faults, despite its importance, is marked by considerable confusion. The terminology in the field is not coherent. How we group faults and relate them to each other, conceptually and from a diagnostic and solution perspective differs.

This edition of the workshop will build on the success of the three first editions that were attended by more than 60 participants. We will continue to look at specific reliability issues of software faults, defects, anomalies or bugs, for a wide variety of industries and types of systems with the goal to identify similarities, differences in processes, categorizations, diagnostics and solutions. A good starting theme would be to look at run-time crashes of systems, and how we relate them to design and implementation flaws.

As part of this edition, we will continue to put a special emphasis on how emerging technologies such as those based on artificial intelligence can be used to detect faults and predict crashes and system failures. In addition, while the general concept of faults is well studied in areas like software testing, domain-specific faults have not received as much attention. IWSF is collocated with ISSRE 2020 (the 31th International Symposium on Software Reliability Engineering), which will be held online on Oct 12 - 15, 2020.

Topics of interest:

We invite researchers and practitioners to submit research papers, position papers, experience reports, and discussion papers.

Topics include but are not limited to:
  • Relationship between run-time crashes and fault types
  • Relationship between faults, defects, anomalies and bugs
  • Fault diagnosis techniques across industry sectors
  • Fault management processes
  • Domain specific faults
  • Artificial intelligence and fault detection and prediction
  • Anomaly detection in execution trace/run time logs
  • Metrics and measurements, and estimation
  • Supporting tools and automation
  • Faults in emerging domains such as cloud computing and IoT
  • Industry best practices
Workshop Program:
See full program.

Important dates:
  • Paper submission deadline: August 3, 2020 August 7, 2020
  • Notification to authors: August 21, 2020
  • Camera ready papers: August 28, 2020
  • Workshop date: October 12, 2020
Workshop format:
  • The workshop will combine keynote presentations, technical talks, and discussion sessions.
Submission instructions:
  • The page limit papers is up to 6 pages. All papers should be submitted as PDF files following the IEEE two-column proceedings format. We recommend that you embed fonts whenever possible to improve portability. We also strongly recommend you print the file and review it for integrity (fonts, symbols, equations, etc.) before submitting it.
  • All papers must be submitted electronically at the following link: https://easychair.org/conferences/?conf=issre2020
  • Accepted peer-reviewed papers will be included in a supplemental volume of the ISSRE conference proceedings, and published by the IEEE Computer Society on IEEE Xplore
Workshop Chairs: Program Committee:
  • Mehdi Adda, University of Québec at Rimouski, Canada
  • Amin Alipour, University of Houston, USA
  • Sigrid Eldh, Ericsson AB, Sweden
  • Naser Ezzati, Brock University, Canada
  • Wahab Hamou-Lhadj, Concordia University, Canada
  • Fehmi Jaafar, CRIM, Canada
  • Raphael Khoury, Université du Québec à Chicoutimi, Canada
  • Alf Larsson, Ericsson AB, Sweden
  • Ingo Pill, Silicon Austria Labs (SAL), Austria
  • Aymen Saied, Laval University, Canada