Infrared emissivity measurement device: principle and applications
Ibos, L., Marchetti, M., Boudenne, A., Datcu, S., Candau, Y. and Livet, J.
2006 Measurement Science and Technology, Volume 17, Number 11
Ibos, L., Marchetti, M., Boudenne, A., Datcu, S., Candau, Y. and Livet, J., (2006), "Infrared emissivity measurement device: principle and applications", Measurement Science and Technology, Volume 17, Number 11.
Abstract:
Infrared emissivity is a necessary parameter for computing models to predict road surface status and pavement temperature irrespective of the weather situation. In this work a new experimental device based on the indirect method was developed for the measurement of surface emissivities. The surface is exposed to modulated isotropic infrared radiation. The intensity reflected by the surface of the sample in a given direction is measured by a detector operating in the spectral range 1¨C40 ¦Ìm. This large spectral range allows measurement of the total hemispheric emissivity defined in this case as emissivity. The effect of the temperature modulation frequency, surface composition and surface roughness on the emissivity measurements was investigated. The results show good ability of the device for the determination of emissivities at room temperature.
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