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IR self-referencing thermography for detection of in-depth defects

Omar, M., Hassan, M. I., Saito, K. and Alloo, R.
2005
Infrared Physics & Technology, 46(4): 283-289
Self-referencing; Thermal absolute contrast; Infrared tomography; Hot spot detection; Adhesion Integrity

Omar, M., Hassan, M. I., Saito, K. and Alloo, R., (2005), "IR self-referencing thermography for detection of in-depth defects", Infrared Physics & Technology, 46(4): 283-289.
Abstract:
Infrared self-referencing thermography is applied here and its importance is illustrated. This technique will eliminate the need for prior knowledge of a defect free area to allow automatic identification of defects from thermograms. The basis of this technique is to divide the thermogram image into small, localized neighborhoods using the assumption that these neighborhoods exhibit the non-defective behavior for the thermal contrast computation. This technique can be utilized in both static (hot spot detection) and dynamic (infrared tomography) cases.

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Author Information and Other Publications Notes
Omar, M.
  1. A combined approach of self-referencing and principle component thermography for transient, steady, and selective heating scenarios  
Hassan, M. I.
  1. their performance and affecting factors  
Saito, K.
     
Alloo, R.
     


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